Pascal and Francis Bibliographic Databases

Help

Search results

Your search

cc.\*:("0785")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 742

  • Page / 30
Export

Selection :

  • and

Removing twin images in X-ray fluorescence holographyHONGLAN XIE; JIANWEN CHEN; HONGYI GAO et al.Optics communications. 2004, Vol 229, Num 1-6, pp 123-129, issn 0030-4018, 7 p.Article

Lensless imaging of magnetic nanostuctures by X-ray spectro-holographyEISEBITT, S; LÜNING, J; SCHLOTTER, W. F et al.Nature (London). 2004, Vol 432, Num 7019, pp 885-888, issn 0028-0836, 4 p.Article

Penetrating radiation systems and applications (Denver CO, 4-5 August 2004)Doty, F. Patrick; Schirato, Richard C; Barber, H. Bradford et al.SPIE proceedings series. 2004, isbn 0-8194-5479-6, V, 180 p, isbn 0-8194-5479-6Conference Proceedings

Limitations on the detection of casting discontinuities using ultrasonics and radiographyKLEVEN, Stuart; BLAIR, Malcolm.Materials evaluation. 2003, Vol 61, Num 4, pp 478-483, issn 0025-5327, 5 p.Article

Detection of plastic deformation and estimation of maximum value of residual stress in low carbon steel by X-ray stress analysis using statistical techniquesKURODA, Masatoshi; YAMANAKA, Shinsuke; ISOBE, Yoshihiro et al.NDT & E international. 2003, Vol 36, Num 7, pp 497-502, issn 0963-8695, 6 p.Article

A new DEI algorithm capable of investigating sub-pixel structuresRIGON, Luigi; BESCH, Hans-Juergen; ARFELLI, Fulvia et al.Journal of physics. D, Applied physics (Print). 2003, Vol 36, Num 10A, pp A107-A112, issn 0022-3727Conference Paper

X-ray detector based on a bulk micromachined photodiode combined with a scintillating crystalROCHA, J. G; SCHABMUELLER, C. G. J; RAMOS, N. F et al.Journal of micromechanics and microengineering (Print). 2003, Vol 13, Num 4, pp S45-S50, issn 0960-1317Conference Paper

Combined microscope for scanning X-ray transmission and surface topographyBROWNE, M. T; CHARALAMBOUS, P; BURGE, R. E et al.Ultramicroscopy. 2002, Vol 92, Num 3-4, pp 221-232, issn 0304-3991, 12 p.Article

Electronic structure of chromium aluminum oxynitride by DV-Xα method and photoelectron spectroscopyYOUNGMIN CHOI; HYUNJU CHANG; JAE DO LEE et al.SPIE proceedings series. 2002, isbn 0-8194-4435-9, 2Vol, vol 1, 455-461Conference Paper

Modeling and simulation of gamma cameraSingh, B; Kataria, S. K; Samuel, A. M et al.2002, [5], 99 pReport

Experimental investigation of the optical signal, gain, signal-to-noise ratio and information content characteristics of X-ray phosphor screensKANDARAKIS, I; CAVOURAS, D; PANAYIOTAKIS, G. S et al.Applied physics. B, Lasers and optics (Print). 2001, Vol 72, Num 7, pp 877-883, issn 0946-2171Article

Fibre direction and content in composites : X-ray Rotation Topography of satellite reflectorsHENTSCHEL, Manfred P; LANGE, Axel; SCHORS, Jörg et al.Materialprüfung. 2001, Vol 43, Num 6, pp 248-253, issn 0025-5300Article

Digital radiographic systems today: State of the art (a review)NEDAVNII, O. I; UDOD, V. A.Russian journal of nondestructive testing. 2001, Vol 37, Num 8, pp 576-591, issn 1061-8309Article

Femtosecond x-rays from thomson scattering using laser wakefield accelerators : Ultra-short electromagnetic pulse science, technology and measurementCATRAVAS, P; ESAREY, E; LEEMANS, W. P et al.Measurement science & technology (Print). 2001, Vol 12, Num 11, pp 1828-1834, issn 0957-0233Article

How to measure the Mueller matrix of liquid-crystal cellsDAHL, Ingolf.Measurement science & technology (Print). 2001, Vol 12, Num 11, pp 1938-1948, issn 0957-0233Article

Measurement of the width of the first excited state in 133CsCHEON, Il-Tong.Journal of the Physical Society of Japan. 2001, Vol 70, Num 11, pp 3193-3196, issn 0031-9015Article

Measuring the body vector of a free flight bumblebee by the reflection beam methodLIJIANG ZENG; QUN HAO; KAWACHI, Keiji et al.Measurement science & technology (Print). 2001, Vol 12, Num 11, pp 1886-1890, issn 0957-0233Article

Concepts for creating ultra-deep trenches using deep X-ray lithographyCHENG, Y; SHEW, B.-Y; LIN, C.-H et al.Sensors and actuators. A, Physical. 2000, Vol 82, Num 1-3, pp 205-209, issn 0924-4247Article

Contribution to residual-stress evaluation in high-stress-gradient zones by X-ray diffractionHENNION, V; SPRAUEL, J. M; MICHAUD, H et al.Journal of applied crystallography. 2000, Vol 33, pp 26-34, issn 0021-8898, 1Article

Diffractometry of wire-drawing dies with local flawsTARLYKOV, V. A.Russian journal of nondestructive testing. 2000, Vol 36, Num 4, pp 276-281, issn 1061-8309Article

A multielement scintillator-photodiode detector array for radiography systemsIGNATOV, S. M; POTAPOV, V. N; FEDIN, A. V et al.Russian journal of nondestructive testing. 1999, Vol 35, Num 2, pp 123-129, issn 1061-8309Article

The radiographer's eyeHOFF, A.Materials evaluation. 1999, Vol 57, Num 1, pp 33-34, issn 0025-5327Article

Portable pulsed electronic digital X-ray imagerWANG YI; WANG JINGJIN; WANG KUILU et al.NDT & E international. 1999, Vol 32, Num 4, pp 215-218, issn 0963-8695Article

The use of contrast agents to enhance crack detection via neutron radiographyBRENIZER, J. S; HOSTICKA, B; BERGER, H et al.NDT & E international. 1999, Vol 32, Num 1, pp 37-42, issn 0963-8695Article

Delbrück scatteringSCHUMACHER, M.Radiation physics and chemistry (1993). 1999, Vol 56, Num 1-2, pp 101-111, issn 0969-806XArticle

  • Page / 30